Substrate |
N/A UV Fused Silica |
Surface Quality (Scratch-Dig) |
N/A 60-40 |
Diameter Tolerance |
N/A +0.0/-0.1 mm |
Thickness Tolerance |
N/A ±0.1 mm |
Reflection |
N/A Rabs>94% @ 532 nm |
Clear Aperture |
N/A ≥10 mm(Φ12.5 mm) ≥22 mm(Φ25 mm) |
Angle of Incidence |
N/A 45 °with a Shift of≤0.20%/degree(35-55 °) |
Laser Wavelength |
N/A 532 nm |
Cut-On Wavelength |
N/A 537.2 nm |
Transmission Band |
N/A Tavg>93% @ 538.9-824.8 nm |
Laser Damage Threshold |
N/A 1J/cm²@532 nm(10ns Pulse Width) |
Diameter |
N/A 12.5 mm |
Transition Band Width |
N/A 5.3 nm |
Edge Slope |
N/A 0.5 % |
P-Polarization Reflection |
N/A Rabs>90% @ 532 nm |
S-Polarization Reflection |
N/A Rabs>98% @ 532 nm |